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Ellipsometric study on the surface of In0.7Ga0.3AsxP1−x thin films exposed to air
Hye-Rim KimVolume:
394
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0040-6090(01)01157-9
File:
PDF, 143 KB
english, 2001