Low temperature measurements of Schottky-barrier...

Low temperature measurements of Schottky-barrier SOI-MOSFETs with dopant segregation

Zhang, M., Knoch, J., Zhao, Q.T., Fox, A., Lenk, St., Mantl, S.
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Volume:
41
Year:
2005
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20052665
File:
PDF, 118 KB
english, 2005
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