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Stoichiometry determination of VOx thin films by 18O-RBS spectrometry
A.D Rata, S Vongtragool, D.O Boerma, T HibmaVolume:
400
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(01)01470-5
File:
PDF, 295 KB
english, 2001