Structural characterization of TiNxOy/TiO2 single...

Thin Solid Films 2001 Vol. 400; Iss. 1-2

Structural characterization of TiNxOy/TiO2 single crystalline and nanometric multilayers grown by LP-MOCVD on (110)TiO2

F Fabreguette, J Guillot, L.P Cardoso, R Marcon, L Imhoff, M.C Marco de Lucas, P Sibillot, S Bourgeois, P Dufour, M Sacilotti
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Volume:
400
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(01)01493-6
File:
PDF, 226 KB
english, 2001
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