Microstructural evolution and electrical property of Ta-doped SnO2 films grown on Al2O3(0001) by metalorganic chemical vapor deposition
Young-Woon Kim, Sang W Lee, Haydn ChenVolume:
405
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0040-6090(01)01635-2
File:
PDF, 1005 KB
english, 2002