Effects of mechanical stress on polycrystalline-silicon resistors
M. Nakabayashi, H. Ohyama, E. Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, K. MiyaharaVolume:
406
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(01)01764-3
File:
PDF, 184 KB
english, 2002