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Spontaneous desorption time of flight mass spectrometry for the analysis of chemical reactions in thin solid films of a few monolayers and up to the micrometer regime
Stephan Krämer, Peter Wohlfart, Rainer Sterthaus, Heiko Einsiedel, Jan Vydra, Silvia MittlerVolume:
411
Year:
2002
Language:
english
Pages:
8
DOI:
10.1016/s0040-6090(02)00292-4
File:
PDF, 178 KB
english, 2002