Study of Work-Function Variation for High- $\kappa $ /Metal-Gate Ge-Source Tunnel Field-Effect Transistors
Lee, Youngtaek, Nam, Hyohyun, Park, Jung-Dong, Shin, ChanghwanVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2436815
Date:
July, 2015
File:
PDF, 3.61 MB
english, 2015