SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optics for Arts, Architecture, and Archaeology V - High-selectivity cleaning of historical paper samples with sizing through femtosecond laser ablation
Pezzati, Luca, Targowski, Piotr, Ersoy, Tansu, Yaman, Çetin, Uguryol, Mehmet, Mavili, Gurcan, Akturk, SelcukVolume:
9527
Year:
2015
Language:
english
DOI:
10.1117/12.2186085
File:
PDF, 1.20 MB
english, 2015