Atomic force microscopy on cross-sections of optical...

Thin Solid Films 1995 Vol. 261; Iss. 1-2

Atomic force microscopy on cross-sections of optical coatings: a new method

Angela Duparré, Carsten Ruppe, Kaj A. Pischow, Miklós Adamik, P.B. Barna
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Volume:
261
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/s0040-6090(94)06505-5
File:
PDF, 715 KB
english, 1995
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