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New application of classical X-ray diffraction methods for epitaxial film characterization
W.J.A.M Peterse, P.M.L.O Scholte, A.J Steinfort, F TuinstraVolume:
289
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(96)08883-9
File:
PDF, 395 KB
english, 1996