Analysis of the depth homogeneity of p-PS by reflectance measurements
M Thönissen, M.G Berger, S Billat, R Arens-Fischer, M Krüger, H Lüth, W Theiß, S Hillbrich, P Grosse, G Lerondel, U FrotscherVolume:
297
Year:
1997
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(96)09420-5
File:
PDF, 309 KB
english, 1997