Photoconductivity — a novel method of evaluation of thin...

Photoconductivity — a novel method of evaluation of thin semiconducting film thickness

B Pohoryles, A Morawski
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Volume:
301
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0040-6090(97)00062-x
File:
PDF, 85 KB
english, 1997
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