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Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques
A.A. Darhuber, J. Stangl, V. Holy, G. Bauer, A. Krost, M. Grundmann, D. Bimberg, V.M. Ustinov, P.S. Kop'ev, A.O. Kosogov, P. WernerVolume:
306
Year:
1997
Language:
english
Pages:
7
DOI:
10.1016/s0040-6090(97)00097-7
File:
PDF, 722 KB
english, 1997