Structural analysis of 2H–WS2 thin films by X-ray and TEM...

Thin Solid Films 1997 Vol. 311; Iss. 1-2

Structural analysis of 2H–WS2 thin films by X-ray and TEM investigation

A Ennaoui, K Diesner, S Fiechter, J.H Moser, F Lévy
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Volume:
311
Year:
1997
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(97)00473-2
File:
PDF, 584 KB
english, 1997
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