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Depth-profiling via X-Ray photoemission and Auger spectroscopies of N+ implanted tungsten carbides grown on the Ti–6Al–4V alloy
N Laidani, C Dorigoni, A Miotello, L Calliari, G Scarel, M SancrottiVolume:
317
Year:
1998
Language:
english
Pages:
4
DOI:
10.1016/s0040-6090(97)00567-1
File:
PDF, 113 KB
english, 1998