SEM and XPS studies of titanium dioxide thin films grown by MOCVD
P Babelon, A.S Dequiedt, H Mostéfa-Sba, S Bourgeois, P Sibillot, M SacilottiVolume:
322
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(97)00958-9
File:
PDF, 1.49 MB
english, 1998