Combined high resolution X-ray diffraction and EXAFS studies of Si(1−x)Gex heterostructures
P De Padova, R Felici, R Larciprete, L Ferrari, L Ortega, V Formoso, F Comin, A BalernaVolume:
319
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(97)01102-4
File:
PDF, 465 KB
english, 1998