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Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction
Maruyama, Toshio, Akiba, Kojiro, Ueda, Mitsutoshi, Kawamura, KenichiVolume:
595-598
Year:
2008
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.595-598.1039
File:
PDF, 513 KB
english, 2008