Passivation and Depassivation of Interface Traps at the...

Materials Science Forum 2012 / 5 Vol. 717-720

Passivation and Depassivation of Interface Traps at the SiO2/4H-SiC Interface by Potassium Ions

Hermannsson, Pétur Gordon, Sveinbjörnsson, Einar Ö.
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Volume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.761
Date:
May, 2012
File:
PDF, 1.05 MB
english, 2012
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