Graphene-based Test Platform in Potential Application for FET with Guanine as Gate Dielectric
Williams, Adrienne D., Ouchen, Fahima, Kim, Steve S., Ngo, Yen H., Elhamri, Said, Siwecki, Arthur, Mou, Shin, Campo, Eva M., Kozlowski, Gregory, Naik, Rajesh R., Grote, JamesVolume:
44
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-3797-2
Date:
October, 2015
File:
PDF, 449 KB
english, 2015