Thickness dependence of the anisotropy in thermal expansion...

Thickness dependence of the anisotropy in thermal expansion of PMDA-ODA and BPDA-PDA thin films

Huey-Chiang Liou, Paul S. Ho, Roger Stierman
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Volume:
339
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0040-6090(98)01065-7
File:
PDF, 247 KB
english, 1999
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