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XPS characterization of tungsten-based contact layers on 4H–SiC
A Kakanakova-Georgieva, Ts Marinova, O Noblanc, C Arnodo, S Cassette, C BrylinskiVolume:
337
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0040-6090(98)01199-7
File:
PDF, 216 KB
english, 1999