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Intensity profiles along the RHEED streaks for various thin film surface morphologies
K. Mae, V.V. Moshchalkov, Y. BruynseraedeVolume:
340
Year:
1999
Language:
english
Pages:
8
DOI:
10.1016/s0040-6090(98)01403-5
File:
PDF, 648 KB
english, 1999