XFEL diffraction: developing processing methods to optimize...

XFEL diffraction: developing processing methods to optimize data quality

Sauter, Nicholas K.
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Volume:
22
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/s1600577514028203
Date:
March, 2015
File:
PDF, 761 KB
english, 2015
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