[IEEE 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC) - KaoHsiung, Taiwan (2014.11.10-2014.11.12)] 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC) - 40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of −40 to 170°C with test screening against write disturb issues

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