A Simple and Accurate Pad-Thru-Short Deembedding Method...

IEEE Transactions on Electron Devices 2015 / 1 Vol. 62; Iss. 1

A Simple and Accurate Pad-Thru-Short Deembedding Method Based on Systematic Analysis for RF Device Characterization

Lee, Chie-In, Lin, Wei-Cheng
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2373033
Date:
January, 2015
File:
PDF, 1.59 MB
english, 2015
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