Influence of Secondary Electron Emission on the...

Japanese Journal of Applied Physics 1991 / 9 Vol. 30; Iss. Part 1, No

Influence of Secondary Electron Emission on the Characteristics of Langmuir Probes

Amemiya, Hiroshi, Fuchs, Gerhard
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Volume:
30
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.30.2099
Date:
September, 1991
File:
PDF, 309 KB
1991
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