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Characterization of the interfacial region of epitaxial TlBiSe2 thin films by infrared spectroscopy and transmission electron microscopy
C.L. Mitsas, E.K. Polychroniadis, D.I. SiapkasVolume:
353
Year:
1999
Language:
english
Pages:
8
DOI:
10.1016/s0040-6090(99)00378-8
File:
PDF, 195 KB
english, 1999