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[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Achieving extreme scan compression for SoC Designs
Wohl, Peter, Waicukauski, John A., Colburn, Jonathon E., Sonawane, MilindYear:
2014
Language:
english
DOI:
10.1109/TEST.2014.7035294
File:
PDF, 830 KB
english, 2014