![](/img/cover-not-exists.png)
Analysis and Thoughts on a 500kV H-GIS Equipment Failure
Wang, Xiao Dan, Xu, Dong Sheng, Wang, Yi, Li, Lu, Zhang, Qing Jun, Lan, Qi, Lu, Yong, Li, HaoVolume:
960-961
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.960-961.871
Date:
June, 2014
File:
PDF, 386 KB
english, 2014