Diffusion induced stress and the distribution of dislocations in a nanostructured thin film electrode during lithiation
Chen, Bingbing, Zhou, Jianqiu, Zhu, Jianwei, Liu, ZhijunVolume:
4
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/C4RA12137F
Date:
November, 2014
File:
PDF, 1.89 MB
english, 2014