Evaluation of the contact resonance frequencies in atomic...

Ultrasonics 2002 Vol. 40; Iss. 1-8

Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation (invited)

U. Rabe, M. Kopycinska, S. Hirsekorn, W. Arnold
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Volume:
40
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0041-624x(02)00089-6
File:
PDF, 322 KB
english, 2002
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