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Corrigendum: Local stress distribution in GaN vertical light-emitting diodes fabricated using CLO and LLO methods
Park, Jinsub, Goto, Takenari, Yao, Takafumi, Lee, Seogwoo, Cho, MoungwhanVolume:
46
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/46/19/199501
Date:
May, 2013
File:
PDF, 27 KB
english, 2013