Dependence of memory characteristics on the (ZrO...

Semiconductor Science and Technology 2015 / 06 Vol. 30; Iss. 6

Dependence of memory characteristics on the (ZrO 2 ) x (SiO 2 ) 1− x elemental composition for charge trap flash memory applications

Tang, Zhenjie, Lu, Xubing, Yang, Yupeng, Zhang, Jing, Ma, Dongwei, Li, Rong, Zhang, Xiwei, Hu, Dan, Li, Tingxian
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Volume:
30
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/30/6/065010
Date:
June, 2015
File:
PDF, 2.69 MB
english, 2015
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