Space mapping methodology for defect recognition in eddy...

COMPEL Int J for Computation and Maths in Electrical and Electronic Eng 2012 / 05 Vol. 31; Iss. 3

Space mapping methodology for defect recognition in eddy current testing – type NDT

Yatchev, Ivan, Putek, Piotr, Crevecoeur, Guillaume, Slodička, Marian, van Keer, Roger, Van de Wiele, Ben, Dupré, Luc
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
31
Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/03321641211209771
Date:
May, 2012
File:
PDF, 302 KB
english, 2012
Conversion to is in progress
Conversion to is failed