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Space mapping methodology for defect recognition in eddy current testing – type NDT
Yatchev, Ivan, Putek, Piotr, Crevecoeur, Guillaume, Slodička, Marian, van Keer, Roger, Van de Wiele, Ben, Dupré, LucVolume:
31
Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/03321641211209771
Date:
May, 2012
File:
PDF, 302 KB
english, 2012