Complex oxide growth using simultaneous in situ reflection high-energy electron diffraction and x-ray reflectivity: When is one layer complete?
Sullivan, M. C., Ward, M. J., Gutiérrez-Llorente, Araceli, Adler, Eli R., Joress, H., Woll, A., Brock, J. D.Volume:
106
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4906419
Date:
January, 2015
File:
PDF, 1.43 MB
english, 2015