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The influence of the CeO2 buffered r-sapphire microstructure on the quality of the YBCO films determined by microwave measurements
Š. Gaži, M. Španková, Š. Chromik, I. Vávra, V. Štrbı́k, P. Gierlowski, S.J. Lewandowski, Š. BeňačkaVolume:
69
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0042-207x(02)00345-7
File:
PDF, 483 KB
english, 2002