[IEEE 2015 IEEE 28th Canadian Conference on Electrical and...

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[IEEE 2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering (CCECE) - Halifax, NS, Canada (2015.5.3-2015.5.6)] 2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering (CCECE) - Research on image denoising using patch-based singular value decomposition

Liu, Han, Zhao, Yue, Liang, Lili, Yi, Yingmin
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Year:
2015
DOI:
10.1109/CCECE.2015.7129350
File:
PDF, 656 KB
2015
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