Closed-Form Expressions for the Noise Voltage Caused by a...

Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

Kim, Jingook, Lee, Jongjoo, Ahn, Seungyoung, Fan, Jun
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2014.2315837
Date:
December, 2014
File:
PDF, 1.50 MB
english, 2014
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