SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Electronic speckle pattern interferometry for fracture expansion in nuclear graphite based on PDE image processing methods
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Tang, Chen, Zhang, Junjiang, Sun, Chen, Su, Yonggang, Su, Kai LeungVolume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184552
File:
PDF, 2.30 MB
english, 2015