SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Advances in Optical Thin Films - Density-related properties of metal oxide films
Pulker, Hans K., Schlichtherle, Stefan S., Amra, Claude, Kaiser, Norbert, Macleod, H. AngusVolume:
5250
Year:
2004
Language:
english
DOI:
10.1117/12.513891
File:
PDF, 283 KB
english, 2004