(Invited) Stress-Induced Asymmetric Switching and Filament...

(Invited) Stress-Induced Asymmetric Switching and Filament Instability in Electrochemical Memories

Ielmini, D., Ambrogio, S., Balatti, S.
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Volume:
64
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/06408.0169ecst
Date:
August, 2014
File:
PDF, 539 KB
english, 2014
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