Buried interface characterization in optoelectronic...

Buried interface characterization in optoelectronic materials by interference microscopy

Benhaddou, Driss, Montgomery, Paul, Montaner, Denis, Bonnaf&#x000E9, , Jacques
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Volume:
48
Language:
english
Journal:
Journal of Modern Optics
DOI:
10.1080/095003401750051451
Date:
March, 2001
File:
PDF, 731 KB
english, 2001
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