Buried interface characterization in optoelectronic materials by interference microscopy
Benhaddou, Driss, Montgomery, Paul, Montaner, Denis, Bonnafé, , JacquesVolume:
48
Language:
english
Journal:
Journal of Modern Optics
DOI:
10.1080/095003401750051451
Date:
March, 2001
File:
PDF, 731 KB
english, 2001