![](/img/cover-not-exists.png)
Phenomenon of resist debris formation in electron beam lithography and its possible application
PR Deshmukh, KJ Rangra, M Singh, PD Vyas, BB PalVolume:
47
Year:
1996
Language:
english
Pages:
7
DOI:
10.1016/s0042-207x(96)00206-0
File:
PDF, 852 KB
english, 1996