Ar+ and He+-ion influence on Si2p and O1s atomic lines an...

Ar+ and He+-ion influence on Si2p and O1s atomic lines an XPS study

O Benkherourou, JP Deville
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Volume:
49
Year:
1998
Language:
english
Pages:
4
DOI:
10.1016/s0042-207x(97)00148-6
File:
PDF, 391 KB
english, 1998
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