STM and photoelectron spectroscopy studies of silicon-cerium dioxide interface formation
M Goshtasbi Rad, B Hirschauer, M Göthelid, UO KarlssonVolume:
49
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0042-207x(97)00174-7
File:
PDF, 833 KB
english, 1998