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[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - Power and sensor semiconductors driving automotive applications
Stork, HansYear:
2015
DOI:
10.1109/vlsi-dat.2015.7114552
File:
PDF, 479 KB
2015