![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Automated Visual Inspection and Machine Vision - Image restoration using aberration taken by a Hartmann wavefront sensor on extended object, towards real-time deconvolution
Beyerer, Jürgen, Puente León, Fernando, Darudi, Ahmad, Bakhshi, Hadi, Asgari, RezaVolume:
9530
Year:
2015
Language:
english
DOI:
10.1117/12.2184852
File:
PDF, 673 KB
english, 2015