CMOS-MEMS Test-Key for Extracting Wafer-Level Mechanical...

CMOS-MEMS Test-Key for Extracting Wafer-Level Mechanical Properties

Chuang, Wan-Chun, Hu, Yuh-Chung, Chang, Pei-Zen
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Volume:
12
Language:
english
Journal:
Sensors
DOI:
10.3390/s121217094
Date:
December, 2012
File:
PDF, 567 KB
english, 2012
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